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Physics

Atomic force microscope

A flexible cantilever traces a nanoscale surface and builds an image.

Atomic force microscope — Actual application image
Actual application image

Try this

The tip scans a smooth nanoscale terrace and a rounded bump. Compare true topography with the feedback reconstruction: excessive scan speed makes the probe lag behind the surface.

The model and its limits

Spherical-tip geometric dilation plus Hertz contact and an elastic cantilever. Prescribed sample, no adhesion or tapping-mode dynamics. Scales are enlarged.

Equations used in the module
Equations
F = k d
F = (4/3) E* √R δ^(3/2)

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